Scalable, Time-of-Flight and Depth-of-Interaction Detector Units for High-Resolution PET Systems
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: 10.1109/TRPMS.2023.3324197
- Ereignis
-
Veröffentlichung
- (wo)
-
Aachen
- (wer)
-
Universitätsbibliothek der RWTH Aachen
- (wann)
-
2023
- Urheber
-
Nadig, Vanessa Victoria
Gundacker, Stefan
Schug, David
Herweg, Katrin
Weindel, Konstantin Alexander
Radermacher, Harald
Müller, Florian
Weissler, Bjoern
Schulz, Volkmar
- DOI
-
10.18154/RWTH-CONV-253062
- URN
-
urn:nbn:de:101:1-2405240134218.615520166456
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:50 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Nadig, Vanessa Victoria
- Gundacker, Stefan
- Schug, David
- Herweg, Katrin
- Weindel, Konstantin Alexander
- Radermacher, Harald
- Müller, Florian
- Weissler, Bjoern
- Schulz, Volkmar
- Universitätsbibliothek der RWTH Aachen
Entstanden
- 2023
Ähnliche Objekte (12)
Depth regulation for spacing drill units
Time-of-flight and depth imaging : sensors, algorithms, and applications
High‐resolution depth measurements in digital microscopic surgery
A high-resolution time-of-flight spectrometer for fission fragments and ion beams
Hochauflösende Prestack-Kirchhoff-Tiefenmigration : = High-resolution Prestack Kirchhoff depth migration
NeuLAND: The high-resolution neutron time-of-flight spectrometer for R3B at FAIR
High-Resolution Experiments with the Multiple-Reflection Time-Of-Flight Mass Spectrometer at the Fragment Separator FRS
Integration of different sample inlets for high-resolution time-of-flight mass spectrometry to investigate heavy petroleum fractions
Application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high performance depth profiling of semiconductor materials
Development of a mobile high-resolution Multiple-Reflection Time-of-Flight Mass Spectrometer for in-situ life science application
Coupling of a High-Resolution Ambient Pressure Drift Tube Ion Mobility Spectrometer to a Commercial Time-of-flight Mass Spectrometer
Scale-up of horizontal packed bed thermal energy storage units: an in-depth experimental and numerical investigation
Depth regulation for spacing drill units
Time-of-flight and depth imaging : sensors, algorithms, and applications
High‐resolution depth measurements in digital microscopic surgery
A high-resolution time-of-flight spectrometer for fission fragments and ion beams
Hochauflösende Prestack-Kirchhoff-Tiefenmigration : = High-resolution Prestack Kirchhoff depth migration
NeuLAND: The high-resolution neutron time-of-flight spectrometer for R3B at FAIR
High-Resolution Experiments with the Multiple-Reflection Time-Of-Flight Mass Spectrometer at the Fragment Separator FRS
Integration of different sample inlets for high-resolution time-of-flight mass spectrometry to investigate heavy petroleum fractions
Application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high performance depth profiling of semiconductor materials
Development of a mobile high-resolution Multiple-Reflection Time-of-Flight Mass Spectrometer for in-situ life science application
Coupling of a High-Resolution Ambient Pressure Drift Tube Ion Mobility Spectrometer to a Commercial Time-of-flight Mass Spectrometer
Scale-up of horizontal packed bed thermal energy storage units: an in-depth experimental and numerical investigation
Depth regulation for spacing drill units
Time-of-flight and depth imaging : sensors, algorithms, and applications
High‐resolution depth measurements in digital microscopic surgery
A high-resolution time-of-flight spectrometer for fission fragments and ion beams
Hochauflösende Prestack-Kirchhoff-Tiefenmigration : = High-resolution Prestack Kirchhoff depth migration
NeuLAND: The high-resolution neutron time-of-flight spectrometer for R3B at FAIR
High-Resolution Experiments with the Multiple-Reflection Time-Of-Flight Mass Spectrometer at the Fragment Separator FRS
Integration of different sample inlets for high-resolution time-of-flight mass spectrometry to investigate heavy petroleum fractions
Application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for high performance depth profiling of semiconductor materials
Development of a mobile high-resolution Multiple-Reflection Time-of-Flight Mass Spectrometer for in-situ life science application
Coupling of a High-Resolution Ambient Pressure Drift Tube Ion Mobility Spectrometer to a Commercial Time-of-flight Mass Spectrometer