High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: 1 Online-Ressource.

Language: Englisch

Bibliographic citation: High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction ; volume:13 ; number:3 ; day:28 ; month:6 ; year:2024 ; pages:641-655 ; date:9.2024
Integrating materials and manufacturing innovation ; 13, Heft 3 (28.6.2024), 641-655, 9.2024

Classification: Biowissenschaften, Biologie

Creator: Fowler, J. Elliott
Ruggles, Timothy J.
Cillessen, Dale E.
Johnson, Kyle L.
Jauregui, Luis J.
Craig, Robert L.
Bianco, Nathan R.
Henriksen, Amelia A.
Boyce, Brad L.

Contributor: SpringerLink (Online service)

DOI: 10.1007/s40192-024-00366-2

URN: urn:nbn:de:101:1-2411261045264.042053809665

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:21 AM CEST

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Associated

Fowler, J. Elliott
Ruggles, Timothy J.
Cillessen, Dale E.
Johnson, Kyle L.
Jauregui, Luis J.
Craig, Robert L.
Bianco, Nathan R.
Henriksen, Amelia A.
Boyce, Brad L.
SpringerLink (Online service)

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High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction

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