Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2045-2322
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy ; volume:12 ; number:1 ; day:5 ; month:8 ; year:2022 ; pages:1-13 ; date:12.2022
Scientific reports ; 12, Heft 1 (5.8.2022), 1-13, 12.2022
- Creator
-
Ihara, Shiro
Saito, Hikaru
Yoshinaga, Mizumo
Avala, Lavakumar
Murayama, Mitsuhiro
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1038/s41598-022-17360-3
- URN
-
urn:nbn:de:101:1-2022121621101534057873
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:22 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Ihara, Shiro
- Saito, Hikaru
- Yoshinaga, Mizumo
- Avala, Lavakumar
- Murayama, Mitsuhiro
- SpringerLink (Online service)
Other Objects (12)
Noncontact in vivo scanning laser microscopy od filtering blebs
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Noise filtering options for conically scanning Doppler lidar measurements with low pulse accumulation
Noise filtering options for conically scanning Doppler LiDAR measurements with low pulse accumulation
Energy filtering transmission electron microscopy
Crackling noise microscopy
Noise filtering for big data analytics
Acoustic scanning probe microscopy
Scanning microscopy : symposium proceedings
Scanning ion conductance microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Noncontact in vivo scanning laser microscopy od filtering blebs
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Noise filtering options for conically scanning Doppler lidar measurements with low pulse accumulation
Noise filtering options for conically scanning Doppler LiDAR measurements with low pulse accumulation
Energy filtering transmission electron microscopy
Crackling noise microscopy
Noise filtering for big data analytics
Acoustic scanning probe microscopy
Scanning microscopy : symposium proceedings
Scanning ion conductance microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Noncontact in vivo scanning laser microscopy od filtering blebs
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Noise filtering options for conically scanning Doppler lidar measurements with low pulse accumulation
Noise filtering options for conically scanning Doppler LiDAR measurements with low pulse accumulation
Energy filtering transmission electron microscopy
Crackling noise microscopy
Noise filtering for big data analytics
Acoustic scanning probe microscopy
Scanning microscopy : symposium proceedings
Scanning ion conductance microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces