Repeated radiation damage and thermal annealing of avalanche photodiodes

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
2196-0763
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Repeated radiation damage and thermal annealing of avalanche photodiodes ; volume:8 ; number:1 ; day:17 ; month:5 ; year:2021 ; pages:1-12 ; date:12.2021
EPJ Quantum Technology ; 8, Heft 1 (17.5.2021), 1-12, 12.2021

Creator
DSouza, Ian
Bourgoin, Jean-Philippe
Higgins, Brendon L.
Lim, Jin Gyu
Tannous, Ramy
Agne, Sascha
Moffat, Brian
Makarov, Vadim
Jennewein, Thomas
Contributor
SpringerLink (Online service)

DOI
10.1140/epjqt/s40507-021-00103-0
URN
urn:nbn:de:101:1-2021091621200699382007
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:20 AM CEST

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Associated

  • DSouza, Ian
  • Bourgoin, Jean-Philippe
  • Higgins, Brendon L.
  • Lim, Jin Gyu
  • Tannous, Ramy
  • Agne, Sascha
  • Moffat, Brian
  • Makarov, Vadim
  • Jennewein, Thomas
  • SpringerLink (Online service)

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