- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783891913956
3891913958
- Dimensions
-
21 cm
- Extent
-
XIII, 261 S.
- Edition
-
1. Aufl.
- Language
-
Deutsch
- Notes
-
graph. Darst.
Zugl.: Zürich, Techn. Hochsch., Diss., 1990
- Bibliographic citation
-
Series in microelectronics ; Vol. 8
- Keyword
-
CMOS-Schaltung
Fehleranalyse
Testmustergenerierung
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
-
Hartung-Gorre
- (when)
-
1991
- Creator
-
Jacomet, Marcel
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 2:18 PM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Jacomet, Marcel
- Hartung-Gorre
Time of origin
- 1991
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Entwicklung monolithisch integrierter optoelektronischer Signalverarbeitungszellen
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Large area photosensing in CMOS
Packaging of CMOS IR microsystems
CMOS based calorimetric chemical microsensors
Thermal imagers in CMOS technology
Industrial CMOS technology for thermal imagers
Mechanical properties of CMOS thin films
CMOS microsystems for thermal presence detection
Thermal properties of CMOS thin films
Entwicklung monolithisch integrierter optoelektronischer Signalverarbeitungszellen
Offset in CMOS magnetotransistors : analysis and reduction
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