Fast fitting of reflectivity data of growing thin films using neural networks
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: Journal of applied crystallography, Band 52, Ausgabe 6, Seite 1342-1347, 2019
- Ereignis
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Veröffentlichung
- (wo)
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Berlin
- (wer)
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Humboldt-Universität zu Berlin
- (wann)
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2022
- Urheber
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Greco, Alessandro
Starostin, Vladimir
Karapanagiotis, Christos
Hinderhofer, Alexander
Gerlach, Alexander L.
Pithan, Linus
Liehr, Sascha
Schreiber, Frank
Kowarik, Stefan
- DOI
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10.1107/S1600576719013311
- URN
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urn:nbn:de:kobv:11-110-18452/25659-5
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:38 MESZ
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Beteiligte
- Greco, Alessandro
- Starostin, Vladimir
- Karapanagiotis, Christos
- Hinderhofer, Alexander
- Gerlach, Alexander L.
- Pithan, Linus
- Liehr, Sascha
- Schreiber, Frank
- Kowarik, Stefan
- Humboldt-Universität zu Berlin
Entstanden
- 2022
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