Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: 19th World Conference on Non-Destructive Testing 2016, Munich, Germany, 13.06.2016 - 17.06.2016
- Klassifikation
-
Physik
- Ereignis
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Veröffentlichung
- (wo)
-
Berlin
- (wer)
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Bundesanstalt für Materialforschung und -prüfung (BAM)
- (wann)
-
2016
- Urheber
-
Shashev, Yury
Kupsch, Andreas
Lange, Axel
Britzke, Ralf
Bruno, Giovanni
Müller, Bernd R.
Hentschel, M. P.
- URN
-
urn:nbn:de:kobv:b43-383163
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:58 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Shashev, Yury
- Kupsch, Andreas
- Lange, Axel
- Britzke, Ralf
- Bruno, Giovanni
- Müller, Bernd R.
- Hentschel, M. P.
- Bundesanstalt für Materialforschung und -prüfung (BAM)
Entstanden
- 2016
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