Monografie
X-ray radiation damage studies and design of a silicon pixel sensor for science at the XFEL
- Sprache
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Englisch
- Umfang
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XIII, 193 S.
- Anmerkungen
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Zugl.: Hamburg, Univ., Diss., 2013
- Identifier
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1036533522
- Reihe
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DESY thesis; 2013,018
Thema
Hochschulschrift
Beteiligte Personen und Organisationen
Zhang, J.
- Inhaltsverzeichnis
- Rechteinformation
-
Der Zugriff auf Teile des Objekts ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.04.2024, 08:49 MESZ
Objekttyp
- Monografie
Beteiligte
- Zhang, J.
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