- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource, 1 online resource.
- Sprache
-
Englisch
- Erschienen in
-
Integer Algorithm: A Useful Tool for Fault Diagnosis of Analog Circuits ; volume:42 ; number:9 ; day:24 ; month:4 ; year:2023 ; pages:5121-5141 ; date:9.2023
Circuits, systems and signal processing ; 42, Heft 9 (24.4.2023), 5121-5141, 9.2023
- Urheber
-
Tadeusiewicz, Michał
Hałgas, Stanisław
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
-
10.1007/s00034-023-02376-5
- URN
-
urn:nbn:de:101:1-2023103110431828673597
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 11:02 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Tadeusiewicz, Michał
- Hałgas, Stanisław
- SpringerLink (Online service)
Ähnliche Objekte (12)
Analog electronic circuits
Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology
Fault simulation for asynchronous circuits
Interval Methods for Analog Circuits
Automated Generation of Fault-Resistant Circuits
Layout synthesis of analog integrated circuits
Layout synthesis of analog integrated circuits
Discrete sizing of analog integrated circuits
Discrete Sizing of Analog Integrated Circuits
Test signal generation for analog circuits
On fault modeling for dynamic MOS circuits
Formal verification methodologies for nonlinear analog circuits
Analog electronic circuits
Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology
Fault simulation for asynchronous circuits
Interval Methods for Analog Circuits
Automated Generation of Fault-Resistant Circuits
Layout synthesis of analog integrated circuits
Layout synthesis of analog integrated circuits
Discrete sizing of analog integrated circuits
Discrete Sizing of Analog Integrated Circuits
Test signal generation for analog circuits
On fault modeling for dynamic MOS circuits
Formal verification methodologies for nonlinear analog circuits
Analog electronic circuits
Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology
Fault simulation for asynchronous circuits
Interval Methods for Analog Circuits
Automated Generation of Fault-Resistant Circuits
Layout synthesis of analog integrated circuits
Layout synthesis of analog integrated circuits
Discrete sizing of analog integrated circuits
Discrete Sizing of Analog Integrated Circuits
Test signal generation for analog circuits
On fault modeling for dynamic MOS circuits