Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1556-276X
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
-
online resource.
- Erschienen in
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Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy ; volume:13 ; number:1 ; day:8 ; month:5 ; year:2018 ; pages:1-11 ; date:12.2018
Nanoscale research letters ; 13, Heft 1 (8.5.2018), 1-11, 12.2018
- Klassifikation
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Physik
- Urheber
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Slobodian, Oleksandr M.
- Beteiligte Personen und Organisationen
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Lytvyn, Peter M.
Nikolenko, Andrii S.
Naseka, Victor M.
Khyzhun, Oleg Yu
Vasin, Andrey V.
Sevostianov, Stanislav V.
Nazarov, Alexei
SpringerLink (Online service)
- DOI
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10.1186/s11671-018-2536-z
- URN
-
urn:nbn:de:101:1-2018071323452055306235
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:30 MESZ
Datenpartner
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Beteiligte
- Slobodian, Oleksandr M.
- Lytvyn, Peter M.
- Nikolenko, Andrii S.
- Naseka, Victor M.
- Khyzhun, Oleg Yu
- Vasin, Andrey V.
- Sevostianov, Stanislav V.
- Nazarov, Alexei
- SpringerLink (Online service)
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