- Weitere Titel
-
Punktdefekte in oxidischen und nitridischen Halbleitern
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
Gießen, Justus-Liebig-Universität, Diss., 2011
- Ereignis
-
Veröffentlichung
- (wo)
-
Gießen
- (wer)
-
Universitätsbibliothek
- (wann)
-
2011
- Urheber
-
Stehr, Jan Eric
- URN
-
urn:nbn:de:hebis:26-opus-85338
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:30 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
- Stehr, Jan Eric
- Universitätsbibliothek
Entstanden
- 2011
Ähnliche Objekte (12)
Oxide and nitride semiconductors : processing, properties, and applications
Gettering defects in semiconductors
Nitride semiconductors and devices : with 23 tables
Phase relations in Zn-group IV-oxide nitride (IV: Ge, Sn) wide gap semiconductors
Organic Photocatalysis: Carbon Nitride Semiconductors vs. Molecular Catalysts
Diffusion of point defects in oxide-dispersion strengthened steels
The atomic structure of point defects in semiconductors by improved EPR, ENDOR data analysis
The atomic structure of point defects in semiconductors by improved EPR, ENDOR data analysis
Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
Advanced defect control in wide-bandgap III-nitride semiconductors
Effect of point defects and dislocations on electrical and optical properties of III-V semiconductors
Chemical Interpretation of Charged Point Defects in Semiconductors: A Case Study of Mg 2 Si
Oxide and nitride semiconductors : processing, properties, and applications
Gettering defects in semiconductors
Nitride semiconductors and devices : with 23 tables
Phase relations in Zn-group IV-oxide nitride (IV: Ge, Sn) wide gap semiconductors
Organic Photocatalysis: Carbon Nitride Semiconductors vs. Molecular Catalysts
Diffusion of point defects in oxide-dispersion strengthened steels
The atomic structure of point defects in semiconductors by improved EPR, ENDOR data analysis
The atomic structure of point defects in semiconductors by improved EPR, ENDOR data analysis
Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
Advanced defect control in wide-bandgap III-nitride semiconductors
Effect of point defects and dislocations on electrical and optical properties of III-V semiconductors
Chemical Interpretation of Charged Point Defects in Semiconductors: A Case Study of Mg 2 Si
Oxide and nitride semiconductors : processing, properties, and applications
Gettering defects in semiconductors
Nitride semiconductors and devices : with 23 tables
Phase relations in Zn-group IV-oxide nitride (IV: Ge, Sn) wide gap semiconductors
Organic Photocatalysis: Carbon Nitride Semiconductors vs. Molecular Catalysts
Diffusion of point defects in oxide-dispersion strengthened steels
The atomic structure of point defects in semiconductors by improved EPR, ENDOR data analysis
The atomic structure of point defects in semiconductors by improved EPR, ENDOR data analysis
Application of optically detected magnetic resonance to the characterization of point defects in semiconductors
Advanced defect control in wide-bandgap III-nitride semiconductors
Effect of point defects and dislocations on electrical and optical properties of III-V semiconductors