EXTENDED MAPTREE: A REPRESENTATION OF FINE-GRAINED TOPOLOGY AND SPATIAL HIERARCHY OF BIM

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
EXTENDED MAPTREE: A REPRESENTATION OF FINE-GRAINED TOPOLOGY AND SPATIAL HIERARCHY OF BIM ; volume:XLII-2/W7 ; year:2017 ; pages:409-415
The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences ; XLII-2/W7 (2017), 409-415

Creator
Wu, Y.
Shang, J.
Hu, X.
Zhou, Z.

DOI
10.5194/isprs-archives-XLII-2-W7-409-2017
URN
urn:nbn:de:101:1-201711107947
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:33 AM CEST

Data provider

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Associated

  • Wu, Y.
  • Shang, J.
  • Hu, X.
  • Zhou, Z.

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