Nanopatterning on silicon surface using atomic force microscopy with diamond-like carbon (DLC)-coated Si probe
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1556-276X
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
Nanopatterning on silicon surface using atomic force microscopy with diamond-like carbon (DLC)-coated Si probe ; volume:6 ; number:1 ; day:2 ; month:9 ; year:2011 ; pages:1-7 ; date:12.2011
Nanoscale research letters ; 6, Heft 1 (2.9.2011), 1-7, 12.2011
- Creator
-
Jiang, Xiaohong
Wu, Guoyun
Zhou, Jingfang
Wang, Shujie
Tseng, Ampere A.
Du, Zuliang
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1186/1556-276X-6-518
- URN
-
urn:nbn:de:101:1-2021081510144980648312
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:51 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Jiang, Xiaohong
- Wu, Guoyun
- Zhou, Jingfang
- Wang, Shujie
- Tseng, Ampere A.
- Du, Zuliang
- SpringerLink (Online service)
Other Objects (12)
bOptimizing atomic force microscopy for characterization of diamond-protein interfaces
Interactions of multilayer coated surfaces studied by colloidal probe atomic force microscopy
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy
Crystallographic plane-orientation dependent atomic force microscopy-based local oxidation of silicon carbide
Coating of Self‐Sensing Atomic Force Microscopy Cantilevers with Boron‐Doped Nanocrystalline Diamond at Low Temperatures
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes
Amplitude modulation atomic force microscopy
Noncontact atomic force microscopy III
Progress in atomic force microscopy
Advanced atomic force microscopy techniques
bOptimizing atomic force microscopy for characterization of diamond-protein interfaces
Interactions of multilayer coated surfaces studied by colloidal probe atomic force microscopy
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy
Crystallographic plane-orientation dependent atomic force microscopy-based local oxidation of silicon carbide
Coating of Self‐Sensing Atomic Force Microscopy Cantilevers with Boron‐Doped Nanocrystalline Diamond at Low Temperatures
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes
Amplitude modulation atomic force microscopy
Noncontact atomic force microscopy III
Progress in atomic force microscopy
Advanced atomic force microscopy techniques
bOptimizing atomic force microscopy for characterization of diamond-protein interfaces
Interactions of multilayer coated surfaces studied by colloidal probe atomic force microscopy
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy
Crystallographic plane-orientation dependent atomic force microscopy-based local oxidation of silicon carbide
Coating of Self‐Sensing Atomic Force Microscopy Cantilevers with Boron‐Doped Nanocrystalline Diamond at Low Temperatures
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Boosting the local anodic oxidation of silicon through carbon nanofiber atomic force microscopy probes
Amplitude modulation atomic force microscopy
Noncontact atomic force microscopy III
Progress in atomic force microscopy