Test‑retest reliability of a smartphone‑based approach‑avoidance task : Effects of retest period, stimulus type, and demographics
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: Behavior research methods. 55(5),S. 2652-2668. ISSN: 1554-3528
- Ereignis
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Veröffentlichung
- (wo)
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Dresden
- (wer)
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Technische Universität Dresden
- (wann)
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2024
- Urheber
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Zech, Hilmar G.
Gable, Philip
van Dijk, Wilco W.
van Dillen, Lotte F.
- URN
-
urn:nbn:de:bsz:14-qucosa2-891404
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:53 MEZ
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Beteiligte
- Zech, Hilmar G.
- Gable, Philip
- van Dijk, Wilco W.
- van Dillen, Lotte F.
- Technische Universität Dresden
Entstanden
- 2024
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