Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1573-4803
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) ; volume:50 ; number:2 ; day:12 ; month:11 ; year:2014 ; pages:493-518 ; date:1.2015
Journal of materials science ; 50, Heft 2 (12.11.2014), 493-518, 1.2015
- Creator
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Newbury, Dale E.
Ritchie, Nicholas W. M.
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s10853-014-8685-2
- URN
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urn:nbn:de:101:1-2021082822521897113885
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:36 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Newbury, Dale E.
- Ritchie, Nicholas W. M.
- SpringerLink (Online service)