Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS)

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1573-4803
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS) ; volume:50 ; number:2 ; day:12 ; month:11 ; year:2014 ; pages:493-518 ; date:1.2015
Journal of materials science ; 50, Heft 2 (12.11.2014), 493-518, 1.2015

Creator
Newbury, Dale E.
Ritchie, Nicholas W. M.
Contributor
SpringerLink (Online service)

DOI
10.1007/s10853-014-8685-2
URN
urn:nbn:de:101:1-2021082822521897113885
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:36 AM CEST

Data provider

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Associated

  • Newbury, Dale E.
  • Ritchie, Nicholas W. M.
  • SpringerLink (Online service)

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