- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540620297
354062029X
- Dimensions
-
25 cm
- Extent
-
XI, 256 S.
- Language
-
Englisch
- Notes
-
graph. Darst.
Literaturangaben
- Bibliographic citation
-
Springer tracts in modern physics ; Vol. 149
- Keyword
-
Dünne Schicht
Röntgenstreuung
Mehrschichtsystem
Röntgenstreuung
- Event
-
Veröffentlichung
- (where)
-
Berlin, Heidelberg, New York, Barcelona, Hong Kong, London, Milan, Paris, Singapore, Tokyo
- (who)
-
Springer
- (when)
-
1999
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 11:55 AM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Holý, Václav
- Pietsch, Ullrich
- Baumbach, Tilo
- Springer
Time of origin
- 1999
Other Objects (12)
Thin film analysis by x-ray scattering
Experiment: X-Ray scattering
Anomalous X-ray scattering
Real-time x-ray scattering studies on organic thin films
High resolution X-ray scattering from thin films to lateral nanostructures
X-ray scattering from silicon surfaces and thin oxides on silicon substrates
Antiferromagnetism in thin films studied by resonant magnetic soft x-ray scattering
X-ray scattering by periodic nanostructures
Coherent methods in X-ray scattering
Ordering phenomena in FeCo films and Fe-Cr multilayers : an x-ray and neutron scattering study
Ordering phenomena in FeCo films and Fe-Cr multilayers : an X-ray and neutron scattering study
X-ray scattering from soft matter thin films : materials science and basic research
Thin film analysis by x-ray scattering
Experiment: X-Ray scattering
Anomalous X-ray scattering
Real-time x-ray scattering studies on organic thin films
High resolution X-ray scattering from thin films to lateral nanostructures
X-ray scattering from silicon surfaces and thin oxides on silicon substrates
Antiferromagnetism in thin films studied by resonant magnetic soft x-ray scattering
X-ray scattering by periodic nanostructures
Coherent methods in X-ray scattering
Ordering phenomena in FeCo films and Fe-Cr multilayers : an x-ray and neutron scattering study
Ordering phenomena in FeCo films and Fe-Cr multilayers : an X-ray and neutron scattering study
X-ray scattering from soft matter thin films : materials science and basic research
Thin film analysis by x-ray scattering
Experiment: X-Ray scattering
Anomalous X-ray scattering
Real-time x-ray scattering studies on organic thin films
High resolution X-ray scattering from thin films to lateral nanostructures
X-ray scattering from silicon surfaces and thin oxides on silicon substrates
Antiferromagnetism in thin films studied by resonant magnetic soft x-ray scattering
X-ray scattering by periodic nanostructures
Coherent methods in X-ray scattering
Ordering phenomena in FeCo films and Fe-Cr multilayers : an x-ray and neutron scattering study
Ordering phenomena in FeCo films and Fe-Cr multilayers : an X-ray and neutron scattering study