Degradation of Surface Passivation on Crystalline Silicon and Its Impact on Light-Induced Degradation Experiments
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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In: IEEE Journal of Photovoltaics ; 7 (2017), 6. - S. 1627-1634. - ISSN 2156-3381. - eISSN 2156-3403
- Classification
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Physik
- Event
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Veröffentlichung
- (where)
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Konstanz
- (who)
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Bibliothek der Universität Konstanz
- (when)
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2017
- Creator
- URN
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urn:nbn:de:bsz:352-2-17rmuyh94881a6
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:46 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Sperber, David
- Graf, Alexander
- Skorka, Daniel
- Herguth, Axel
- Hahn, Giso
- Bibliothek der Universität Konstanz
Time of origin
- 2017
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Silicon Nitride Deposition : Impact on Lifetime and Light-Induced Degradation at Elevated Temperature in Multicrystalline Silicon
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Temperature induced degradation of the contact resistance of Ag-screen printed p-type silicon solar cells
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Investigation on the dependence of degradation rate on hole concentration during boron-oxygen related light-induced degradation in crystalline silicon
Light-induced degradation variation in industrial multicrystalline PERC silicon solar cells
Silicon Nitride Deposition : Impact on Lifetime and Light-Induced Degradation at Elevated Temperature in Multicrystalline Silicon
A 3-state defect model for light-induced degradation in boron-doped float-zone silicon
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Temperature induced degradation of the contact resistance of Ag-screen printed p-type silicon solar cells
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