- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
-
Determining amplitude and tilt of a lateral force microscopy sensor ; volume:12 ; pages:517-524
Beilstein journal of nanotechnology ; 12, 517-524
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.12.42
- URN
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urn:nbn:de:101:1-2021102209375018114662
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:30 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
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