Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Erschienen in
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Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air ; volume:5 ; pages:1637-1648
Beilstein journal of nanotechnology ; 5, 1637-1648
- Klassifikation
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.5.175
- URN
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urn:nbn:de:101:1-2015012826728
- Rechteinformation
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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15.08.2025, 07:26 MESZ
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