Solution‐Processed High‐Performance ZnO Nano‐FETs Fabricated with Direct‐Write Electron‐Beam‐Lithography‐Based Top‐Down Route

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: Solution‐Processed High‐Performance ZnO Nano‐FETs Fabricated with Direct‐Write Electron‐Beam‐Lithography‐Based Top‐Down Route ; year:2021
Advanced electronic materials ; (2021)

Creator: Tiwale, Nikhil
Senanayak, Satyaprasad P.
Rubio‐Lara, Juan
Prasad, Abhinav
Aziz, Atif
Alaverdyan, Yury
Welland, Mark E.

DOI: 10.1002/aelm.202000978

URN: urn:nbn:de:101:1-2021020408273332675833

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:26 AM CEST

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Tiwale, Nikhil
Senanayak, Satyaprasad P.
Rubio‐Lara, Juan
Prasad, Abhinav
Aziz, Atif
Alaverdyan, Yury
Welland, Mark E.

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Solution‐Processed High‐Performance ZnO Nano‐FETs Fabricated with Direct‐Write Electron‐Beam‐Lithography‐Based Top‐Down Route

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