Fast fitting of reflectivity data of growing thin films using neural networks
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Journal of Applied Crystallography, 52, S. 1342-1347
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
-
Bundesanstalt für Materialforschung und -prüfung (BAM)
- (wann)
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2019
- Urheber
-
Greco, A.
Starostin, V.
Karapanagiotis, C.
Hinderhofer, A.
Gerlach, A.
Pithan, L.
Liehr, Sascha
Schreiber, Frank
Kowarik, Stefan
- DOI
-
10.1107/S1600576719013311
- URN
-
urn:nbn:de:kobv:b43-498997
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:45 MESZ
Datenpartner
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Beteiligte
- Greco, A.
- Starostin, V.
- Karapanagiotis, C.
- Hinderhofer, A.
- Gerlach, A.
- Pithan, L.
- Liehr, Sascha
- Schreiber, Frank
- Kowarik, Stefan
- Bundesanstalt für Materialforschung und -prüfung (BAM)
Entstanden
- 2019
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