Correction: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource, 1 online resource.
- Sprache
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Englisch
- Erschienen in
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Correction: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions ; day:1 ; month:8 ; year:2023 ; pages:1-2
Flexible services and manufacturing journal ; (1.8.2023), 1-2
- Klassifikation
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Recht
- Urheber
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Deenen, Patrick C.
Middelhuis, Jeroen
Akcay, Alp
Adan, Ivo J. B. F.
- Beteiligte Personen und Organisationen
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SpringerLink (Online service)
- DOI
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10.1007/s10696-023-09504-y
- URN
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urn:nbn:de:101:1-2023110108383401830235
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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14.08.2025, 10:59 MESZ
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Beteiligte
- Deenen, Patrick C.
- Middelhuis, Jeroen
- Akcay, Alp
- Adan, Ivo J. B. F.
- SpringerLink (Online service)
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