Integrated Bayesian analysis of rare exonic variants to identify risk genes for schizophrenia and neurodevelopmental disorders
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1756-994X
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Integrated Bayesian analysis of rare exonic variants to identify risk genes for schizophrenia and neurodevelopmental disorders ; volume:9 ; number:1 ; day:20 ; month:12 ; year:2017 ; pages:1-22 ; date:12.2017
Genome medicine ; 9, Heft 1 (20.12.2017), 1-22, 12.2017
- Keyword
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Erbkrankheit
Erbschaden
- Creator
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Nguyen, Hoang T.
- Contributor
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Bryois, Julien
Kim, April
Dobbyn, Amanda
Huckins, Laura M.
Munoz-Manchado, Ana B.
Ruderfer, Douglas M.
Genovese, Giulio
Fromer, Menachem
Xu, Xinyi
Pinto, Dalila
Linnarsson, Sten
Verhage, Matthijs
Smit, August B.
Hjerling-Leffler, Jens
Buxbaum, Joseph D.
Hultman, Christina
Sklar, Pamela
Purcell, Shaun M.
Lage, Kasper
He, Xin
Sullivan, Patrick F.
Stahl, Eli A.
SpringerLink (Online service)
- DOI
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10.1186/s13073-017-0497-y
- URN
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urn:nbn:de:1111-20180219869
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 11:00 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Nguyen, Hoang T.
- Bryois, Julien
- Kim, April
- Dobbyn, Amanda
- Huckins, Laura M.
- Munoz-Manchado, Ana B.
- Ruderfer, Douglas M.
- Genovese, Giulio
- Fromer, Menachem
- Xu, Xinyi
- Pinto, Dalila
- Linnarsson, Sten
- Verhage, Matthijs
- Smit, August B.
- Hjerling-Leffler, Jens
- Buxbaum, Joseph D.
- Hultman, Christina
- Sklar, Pamela
- Purcell, Shaun M.
- Lage, Kasper
- He, Xin
- Sullivan, Patrick F.
- Stahl, Eli A.
- SpringerLink (Online service)