Integrated Bayesian analysis of rare exonic variants to identify risk genes for schizophrenia and neurodevelopmental disorders

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1756-994X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Integrated Bayesian analysis of rare exonic variants to identify risk genes for schizophrenia and neurodevelopmental disorders ; volume:9 ; number:1 ; day:20 ; month:12 ; year:2017 ; pages:1-22 ; date:12.2017
Genome medicine ; 9, Heft 1 (20.12.2017), 1-22, 12.2017

Keyword
Erbkrankheit
Erbschaden

Creator
Nguyen, Hoang T.
Contributor
Bryois, Julien
Kim, April
Dobbyn, Amanda
Huckins, Laura M.
Munoz-Manchado, Ana B.
Ruderfer, Douglas M.
Genovese, Giulio
Fromer, Menachem
Xu, Xinyi
Pinto, Dalila
Linnarsson, Sten
Verhage, Matthijs
Smit, August B.
Hjerling-Leffler, Jens
Buxbaum, Joseph D.
Hultman, Christina
Sklar, Pamela
Purcell, Shaun M.
Lage, Kasper
He, Xin
Sullivan, Patrick F.
Stahl, Eli A.
SpringerLink (Online service)

DOI
10.1186/s13073-017-0497-y
URN
urn:nbn:de:1111-20180219869
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 11:00 AM CEST

Data provider

This object is provided by:
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Associated

  • Nguyen, Hoang T.
  • Bryois, Julien
  • Kim, April
  • Dobbyn, Amanda
  • Huckins, Laura M.
  • Munoz-Manchado, Ana B.
  • Ruderfer, Douglas M.
  • Genovese, Giulio
  • Fromer, Menachem
  • Xu, Xinyi
  • Pinto, Dalila
  • Linnarsson, Sten
  • Verhage, Matthijs
  • Smit, August B.
  • Hjerling-Leffler, Jens
  • Buxbaum, Joseph D.
  • Hultman, Christina
  • Sklar, Pamela
  • Purcell, Shaun M.
  • Lage, Kasper
  • He, Xin
  • Sullivan, Patrick F.
  • Stahl, Eli A.
  • SpringerLink (Online service)

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