- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1573-0727
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Stress-Aware Periodic Test of Interconnects ; volume:37 ; number:5-6 ; day:4 ; month:1 ; year:2022 ; pages:715-728 ; date:12.2021
Journal of electronic testing ; 37, Heft 5-6 (4.1.2022), 715-728, 12.2021
- Urheber
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
-
10.1007/s10836-021-05979-5
- URN
-
urn:nbn:de:101:1-2022051618575570972125
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:33 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Sadeghi-Kohan, Somayeh
- Hellebrand, Sybille
- Wunderlich, Hans-Joachim
- SpringerLink (Online service)
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