Hochschulschrift
Calibrated on-wafer characterization of mm-wave integrated circuits - parasitic effects and improved coplanar waveguide model
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Dimensions
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30 cm
- Extent
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v, 138 Blätter
- Language
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Englisch
- Notes
-
Illustrationen
Technische Universität Berlin, Dissertation, 2021
- Classification
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Elektrotechnik, Elektronik
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 1:52 PM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
Time of origin
- 2021
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