Identification of Suspicious Semiconductor Devices Using Independent Component Analysis with Dimensionality Reduction
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
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In: Advanced Semiconductor Manufacturing Conference (ASMC). Saratoga Springs, 06.05. - 09.05.2019
In: 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), Erscheinungsort: New York, Verlag: Institute of Electrical and Electronics Engineers (IEEE), Erscheinungsjahr: 2019
- Klassifikation
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Elektrotechnik, Elektronik
- Ereignis
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Veröffentlichung
- (wo)
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Dresden
- (wer)
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Technische Universität Dresden
- (wann)
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2019
- Urheber
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Bartholomäus, Jenny
Wunderlich, Sven
Sasvári, Zoltán
- URN
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urn:nbn:de:bsz:14-qucosa2-351297
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:36 MESZ
Datenpartner
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Beteiligte
- Bartholomäus, Jenny
- Wunderlich, Sven
- Sasvári, Zoltán
- Technische Universität Dresden
Entstanden
- 2019
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