X-ray characterization of materials

to connected objects

Location: Deutsche Nationalbibliothek Frankfurt am Main

ISBN: 9783527296576
3527296573

Dimensions: 25 cm

Extent: XVI, 261 S.

Language: Deutsch

Notes: Ill., graph. Darst.
Literaturangaben

Keyword: Röntgenbeugung
Zerstörungsfreie Werkstoffprüfung
Synchrotronstrahlung
Zerstörungsfreie Werkstoffprüfung
Röntgenfluoreszenzspektroskopie
Zerstörungsfreie Werkstoffprüfung
Röntgen-Kleinwinkelstreuung
Zerstörungsfreie Werkstoffprüfung
Neutronenkleinwinkelstreuung
Zerstörungsfreie Werkstoffprüfung

Event: Veröffentlichung

(where): Weinheim, New York, Chichester, Brisbane, Singapore, Toronto

(who): Wiley-VCH

(when): 1999

Contributor: Lifshin, Eric

Table of contents: https://d-nb.info/956262872/04

Rights: Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.

Last update: 11.06.2025, 2:07 PM CEST

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Associated

Lifshin, Eric
Wiley-VCH

Time of origin

1999

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X-ray characterization of materials

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Time of origin

Other Objects (12)

Thin film analysis by x-ray scattering

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