Using infrared nano-spectroscopy to analyze the influence of defects on the local electronic properties in resistively switching oxides and chalcogenides

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Alternative title: Analyse des Einflusses von Defekten auf die lokalen elektronischen Eigenschaften von resistiv schaltenden Oxiden und Chalcogeniden mittels infraroter nano-Spektroskopie

Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Notes: RWTH Aachen University, Dissertation, 2020

Keyword: Oxides
Spectrum analysis
Chalcogenides

Event: Veröffentlichung

(where): Aachen

(who): Universitätsbibliothek der RWTH Aachen

(when): 2020

Creator: Lewin, Martin

Contributor: Taubner, Thomas
Wuttig, Matthias

DOI: 10.18154/RWTH-2020-05866

URN: urn:nbn:de:101:1-2020082507341408398359

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 14.08.2025, 11:01 AM CEST

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Lewin, Martin
Taubner, Thomas
Wuttig, Matthias
Universitätsbibliothek der RWTH Aachen

Time of origin

2020

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Using infrared nano-spectroscopy to analyze the influence of defects on the local electronic properties in resistively switching oxides and chalcogenides

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Other Objects (12)

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