- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Deutsch
- Anmerkungen
-
Erlangen, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Dissertation, 2022
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
Siliciumcarbid
MOS-FET
Gate-Oxid
Elektrische Eigenschaft
- Ereignis
-
Veröffentlichung
- (wo)
-
Erlangen
- (wer)
-
Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
- (wann)
-
2022
- Urheber
- Beteiligte Personen und Organisationen
-
Erlbacher, Tobias
- URN
-
urn:nbn:de:bvb:29-opus4-200749
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:21 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Albrecht, Matthäus
- Erlbacher, Tobias
- Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
Entstanden
- 2022
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