Evaluation of processing steps regarding lifetime of iron/copper contaminated mc Si wafers
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: Proceedings of the 24th European Photovoltaic Solar Energy Conference. - München : WIP - Wirtschaft und Infrastruktur, 2009. - S. 2152-2156. - ISBN 3-936338-25-6
In: 24th European Photovoltaic Solar Energy, 21. Sep 2009 - 25. Sep 2009, Hamburg
- Klassifikation
-
Physik
- Ereignis
-
Veröffentlichung
- (wo)
-
Konstanz
- (wer)
-
Bibliothek der Universität Konstanz
- (wann)
-
2009
- Urheber
- URN
-
urn:nbn:de:bsz:352-opus-104112
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:43 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Zuschlag, Annika
- Junge, Johannes
- Seren, Sven
- Hahn, Giso
- Bibliothek der Universität Konstanz
Entstanden
- 2009
Ähnliche Objekte (12)
Injection resolved spatial lifetime mapping using photoluminescence
Effective lifetime variations significant for process evaluation or just an artifact of wafer size and quality? : An attempt to quantify material induced variations
Stability test on Cz and Tri-Silicon wafers with different surface morphologies
Status of selective emitter technology
Degradation and Regeneration in mc-Si after different gettering steps
Degradation and regeneration in mc-Si after different gettering steps
Bulk passivation in silicon ribbons : a lifetime study for an enhanced high efficiency process
Progress in mechanically shuttered time-resolved photoluminescence imaging of silicon wafers
Comparison of the passivation quality of boron and aluminum BSF for wafers of varying thickness
Mapping of hydrogen bond energies in EFG silicon samples by analysis of spatially resolved minority charge carrier lifetimes after annealing steps
Influence of pyramid size of chemically textured silicon wafers on the characteristics of industrial solar cells
Minority carrier lifetime monitoring in a buried contact solar cells process using MC-SI
Injection resolved spatial lifetime mapping using photoluminescence
Effective lifetime variations significant for process evaluation or just an artifact of wafer size and quality? : An attempt to quantify material induced variations
Stability test on Cz and Tri-Silicon wafers with different surface morphologies
Status of selective emitter technology
Degradation and Regeneration in mc-Si after different gettering steps
Degradation and regeneration in mc-Si after different gettering steps
Bulk passivation in silicon ribbons : a lifetime study for an enhanced high efficiency process
Progress in mechanically shuttered time-resolved photoluminescence imaging of silicon wafers
Comparison of the passivation quality of boron and aluminum BSF for wafers of varying thickness
Mapping of hydrogen bond energies in EFG silicon samples by analysis of spatially resolved minority charge carrier lifetimes after annealing steps
Influence of pyramid size of chemically textured silicon wafers on the characteristics of industrial solar cells
Minority carrier lifetime monitoring in a buried contact solar cells process using MC-SI
Injection resolved spatial lifetime mapping using photoluminescence
Effective lifetime variations significant for process evaluation or just an artifact of wafer size and quality? : An attempt to quantify material induced variations
Stability test on Cz and Tri-Silicon wafers with different surface morphologies
Status of selective emitter technology
Degradation and Regeneration in mc-Si after different gettering steps
Degradation and regeneration in mc-Si after different gettering steps
Bulk passivation in silicon ribbons : a lifetime study for an enhanced high efficiency process
Progress in mechanically shuttered time-resolved photoluminescence imaging of silicon wafers
Comparison of the passivation quality of boron and aluminum BSF for wafers of varying thickness
Mapping of hydrogen bond energies in EFG silicon samples by analysis of spatially resolved minority charge carrier lifetimes after annealing steps
Influence of pyramid size of chemically textured silicon wafers on the characteristics of industrial solar cells